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              TAP1500 1.5 GHz有源探頭

              TAP1500 1.5 GHz有源探頭

              型號:TAP1500

              產品時間:2023-11-11

              簡要描述:

              TAP1500 1.5 GHz有源探頭用戶應選擇具有低輸入電容指標 (~1 pF) 的探頭以大CHENG度降低探頭對電路的負載影響。

              推薦產品
              詳細介紹

              TAP1500 1.5 GHz有源探頭Single-ended Active FET Probe provides excellent high-speed electrical and mechanical performance required for today's digital system designs.

              Key features

              • Outstanding electrical performance
                • ≥1.5 GHz probe bandwidth
                • <267 ps rise time
                • ≤1 pF input capacitance
                • 1 M? input resistance
                • -8 V to +8 V input dynamic range
                • -10 V to +10 VDC input offset range
              • Versatile mechanical performance
                • Small compact probe head for probing small geometry circuit elements
                • DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
                • Robust design for reliability
              • Easy to use
                • Connects directly to oscilloscopes with the TekVPI™ probe interface
                • Provides automatic units scaling and readout on the oscilloscope display
                • Easy access to oscilloscope probe menu display for probe status/diagnostic information, and to control probe DC offset
                • Remote GPIB/USB probe control through the oscilloscope
              • Applications
                • High-speed Digital Systems Design
                • Component Design and Characterization
                • Manufacturing Engineering and Test
                • Educational Research
                • Signals with Voltage Swings up to 16 V

              TAP1500 1.5 GHz有源探頭 active probes for TekVPI™ probe interface

              Specifically designed for use and direct connection to oscilloscopes with the TekVPI™ probe interface, the TAP1500 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:

              • Lower DUT loading effects with ≤1 pF input capacitance and 1 M? input resistance
              • Versatile DUT connectivity for attaching to small SMDs
              • Preserves instrument bandwidth at the probe tip for ≤1 GHz oscilloscopes

               


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